Kumar, R. and Norgia, M. (2026) Closing editorial: advancements in optical measurement devices and technologies. Metrology, 6 (1). pp. 1-5. ISSN 2673-8244
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Abstract
Optical measurement technologies have emerged as indispensable tools in modern metrology, offering precision, noninvasive measurement capabilities, and remarkable versatility across diverse scientific and industrial applications [1,2]. The field of optical metrology encompasses a wide range of techniques, from classical interferometry to quantum-enhanced measurements, each contributing to our ability to measure physical quantities with ever-increasing accuracy [3]. As we enter an era defined by the second quantum revolution, optical measurement devices are at the forefront of technological innovation, enabling breakthroughs in fields ranging from fundamental physics to advanced manufacturing [4,5].
| Publication Type: | Articles |
|---|---|
| Uncontrolled Keywords: | optical measurement devices, quantum metrology, interferometry, spectroscopy, photonic devices |
| Subjects: | Q Science > Q Science (General) T Technology > T Technology (General) T Technology > TA Engineering (General). Civil engineering (General) T Technology > TJ Mechanical engineering and machinery T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Academic Areas > Department of Engineering, Computing and Design Research Entities > Centre for Future Technologies |
| SWORD Depositor: | Publications Router Jisc |
| Depositing User: | Publications Router Jisc |
| Date Deposited: | 10 Mar 2026 15:15 |
| Last Modified: | 10 Mar 2026 15:15 |
| URI: | https://eprints.chi.ac.uk/id/eprint/8546 |
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