Effect of stoichiometry on AC and DC breakdown of silicon nitride/epoxy nanocomposites

Alhabill, F. N., Vaughan, A. S., Anani, N. and Andritsch, T. (2021) Effect of stoichiometry on AC and DC breakdown of silicon nitride/epoxy nanocomposites. IEEE Transactions on Dielectrics and Electrical Insulation, 28 (4). pp. 1231-1237. ISSN 1558-4135

[thumbnail of © 2022 IEEE.  Personal use of this material is permitted] Text (© 2022 IEEE. Personal use of this material is permitted)
TDEI Article.pdf - Accepted Version
Available under License Creative Commons Attribution 4.0.

Download (913kB)

Abstract

This study investigates the electrical behavior of silicon nitride/epoxy nanocomposites. It is demonstrated that the presence of the nanofiller affects the resin/hardener stoichiometry, which results in the development of different network structures throughout the matrix polymer. However, detailed analysis shows that this stoichiometric effect cannot account, alone, for the observed changes in the electrical behavior of the nanocomposite samples. A comparison between the electrical behavior of filled and the unfilled samples, where appropriate stoichiometric compensation has been applied, indicates that there is an additional effect that is exclusively a function of the nanofiller loading and which is superimposed on any matrix chemistry effects. Potential explanations for this nanoparticle effect are discussed, including: nanoparticle agglomeration; water shells around the nanoparticles; the influence of nanoparticles on matrix dynamics, structure or the free volume content of polymer interphase.

Item Type: Article
Additional Information: Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Uncontrolled Keywords: Electrical and Electronic Engineering
Subjects: Q Science > Q Science (General)
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Academic Areas > Department of Engineering, Computing and Design
Depositing User: Fuad Alhabill
Date Deposited: 17 Jun 2021 10:46
Last Modified: 14 Jul 2022 14:06
URI: https://eprints.chi.ac.uk/id/eprint/5819

Actions (login required)

View Item
View Item