Effect of Resin/Hardener Stoichiometry on Electrical Behavior of Epoxy Networks

Alhabill, Fuad N., Ayoob, Raed, Andritsch, Thomas and Vaughan, Alun S. (2017) Effect of Resin/Hardener Stoichiometry on Electrical Behavior of Epoxy Networks. IEEE Transactions on Dielectrics and Electrical Insulation, 24 (6). 3739 -3749. ISSN 1070-9878

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Abstract

By changing the ratio of resin to hardener, a series of epoxy resin samples has been
produced with differing network structures and different retained chemical
functionalities. The resulting materials were characterized by thermal analysis, dielectric
spectroscopy, DC conductivity, and DC and AC breakdown strength measurements, to
explore the effect of network structure and chemical composition on molecular dynamics
and electrical properties. Differential scanning calorimetry showed that the glass
transition temperature is primarily determined by the crosslinking density and indicates
that, under the range of conditions employed here, side reactions, such as etherification
or homopolarization, are negligible. Conversely, changes in DC conductivity with resin
stoichiometry appear to occur as a result of changes in the chemical content of the system,
rather than variations in network structure or dynamics. Specifically, we suggest that the
DC conductivity is markedly affected by the residual amine group concentration in the
system. While DC conductivity and DC breakdown appear broadly to be correlated, AC
breakdown results indicated that this parameter does not vary with changing
stoichiometry, which suggests that the AC and DC breakdown strengths are controlled
by different mechanisms.

Item Type: Article
Additional Information: Department for Engineering & Applied Design. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Related URLs:
Depositing User: Fuad Alhabill
Date Deposited: 17 Oct 2019 11:14
Last Modified: 31 Oct 2019 13:04
URI: http://eprints.chi.ac.uk/id/eprint/4891

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